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技術(shù)說(shuō)明：853-064940-206 Lam 研究所模擬輸出線束
853-064940-206 EMC實(shí)驗(yàn)中會(huì)有一些注意事項(xiàng)，而每個(gè)EMC工程師的一些操作手法都不盡相同，特別是測(cè)試時(shí)候線束擺放的位置和機(jī)器的位置，而往往就是一些小細(xì)節(jié)導(dǎo)致EMC測(cè)試出現(xiàn)問(wèn)題，例如我們今天講的EMI測(cè)試時(shí)線束擺放的問(wèn)題，對(duì)于機(jī)器線束擺放也是實(shí)驗(yàn)中較為重要的一環(huán)，不同的位置擺放和線束擺放會(huì)有不一樣的測(cè)試結(jié)果。
二輻射天線
853-064940-206 由于輻射發(fā)射的問(wèn)題會(huì)有很大部分原因是由PCB的干擾傳導(dǎo)或者耦合到線束上，通過(guò)線束輻射出來(lái)，進(jìn)而讓天線接收到，形成EMI干擾，導(dǎo)致EMI實(shí)驗(yàn)不能通過(guò)測(cè)試標(biāo)準(zhǔn)。實(shí)驗(yàn)室測(cè)試時(shí)，會(huì)有工程師對(duì)EUT進(jìn)行調(diào)試和擺放，在一定的工作模式下，不同線束的擺放會(huì)導(dǎo)致不同的測(cè)試數(shù)據(jù)，線束擺放會(huì)呈現(xiàn)垂直或者水平，不同的擺放方式，接收天線所接收到的干擾會(huì)是不一樣的。當(dāng)線束垂直，天線方向也處于垂直時(shí)，這樣接收天線所接收到的能量會(huì)是比較大的；同理，水平方向亦是如此。
853-064940-206 EUT本體結(jié)構(gòu)、線纜、端口、PCB、信號(hào)類(lèi)型等的影響，就導(dǎo)致產(chǎn)生出不同的類(lèi)型極化的波，其中不乏分垂直與水平極化方向的波，其中的能量大小異同，而在接收天線上產(chǎn)生的極化損失也就不同。當(dāng)來(lái)波的極化方向與接收天線的極化方向不一致時(shí)，接收到的信號(hào)都會(huì)變小，也就是說(shuō)，發(fā)生極化損失。
三測(cè)試數(shù)據(jù)對(duì)比
853-064940-206 有時(shí)我們的被測(cè)機(jī)器設(shè)備EUT電源線束，還有和輔助設(shè)備之間所連接的線束比較長(zhǎng)時(shí)，若是不將線束捆扎或者捆扎后線束依舊過(guò)長(zhǎng)，機(jī)器的噪聲干擾會(huì)通過(guò)這些長(zhǎng)線束輻射出來(lái)，所以有時(shí)能決定線束的長(zhǎng)度，優(yōu)先選擇與EUT所連接盡可能短一點(diǎn)的線束。
當(dāng)被測(cè)設(shè)備的線束過(guò)長(zhǎng)時(shí)需要把線束按照測(cè)試標(biāo)準(zhǔn)進(jìn)行折疊和擺放，而有這么一個(gè)案例，因線束的折疊方式和長(zhǎng)度的不同會(huì)有不同的測(cè)試數(shù)據(jù)，并且過(guò)長(zhǎng)的線束會(huì)直接導(dǎo)致實(shí)驗(yàn)結(jié)果失敗。我們做了一個(gè)實(shí)驗(yàn)對(duì)比，當(dāng)把線束中心處捆扎成50cm長(zhǎng)度和10cm長(zhǎng)度，在工作模式和其他測(cè)試條件相同的情況下測(cè)試，對(duì)比數(shù)據(jù)可以看出，50cm捆扎線束的數(shù)據(jù)相對(duì)于10cm捆扎線束的數(shù)據(jù)會(huì)比較差。
853-049542-173
853-064940-206 There will be some precautions in EMC experiments, and each EMC engineer has different operation methods, especially the position of the wiring harness and the position of the machine during the test, and it is often some small details that lead to EMC test problems, such as the wiring harness placement problem in EMI test we talked about today. For the machine wiring harness placement is also a more important part of the experiment, different placement and wiring harness placement will have different test results.
Two-radiation antenna
853-064940-206 Due to the problem of radiation emission, a large part of the problem is caused by the interference conduction or coupling of PCB to the wire harness, which is radiated through the wire harness and then received by the antenna, forming EMI interference, resulting in EMI experiments that cannot pass the test standards. During laboratory testing, engineers will debug and place EUT. Under certain working modes, different placement of wire harnesses will lead to different test data. The placement of wire harnesses will be vertical or horizontal. When the wiring harness is vertical and the antenna direction is also vertical, the energy received by the receiving antenna will be relatively large; The same is true for the horizontal direction.
853-064940-206 The influence of EUT body structure, cable, port, PCB, signal type, etc., leads to the generation of different types of polarized waves, including waves in the vertical and horizontal polarization directions, where the energy size is different, and the polarization loss generated on the receiving antenna is different. When the polarization direction of the incoming wave is inconsistent with the polarization direction of the receiving antenna, the received signal will become smaller, that is, the polarization loss occurs.
Three test data comparison
853-064940-206 Sometimes our measured machine equipment EUT power harness, and the wiring harness connected to the auxiliary equipment is relatively long, if the wiring harness is not tied or the wiring harness is still too long after tying, the noise interference of the machine will radiate out through these long wiring harnesses, so sometimes the length of the wiring harness can be determined, and the wiring harness connected with the EUT is preferred to be as short as possible.
When the wiring harness of the device under test is too long, it is necessary to fold and place the wiring harness according to the test standard. There is such a case that the test data will be different due to the different folding mode and length of the wiring harness, and too long wiring harness will directly lead to the failure of the experiment results. We made an experiment comparison, when the center of the wiring harness is bundled into 50cm length and 10cm length, under the same working mode and other test conditions, the comparison data can be seen that the data of 50cm bundled wiring harness is worse than that of 10cm bundled wiring harness.
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